| 10.15-10.40 | Ontvangst en koffie |
| 10.40-10.45 | Inleiding door de dagvoorzitter, F. Tuinstra |
| 10.45-10.50 | Welkomstwoord door Pauline Jäger, Avantium Technologies |
| 10.50-11.25 | J. Mazurek, Avantium Technologies RD lab for screening and charcterization of active pharmaceutical compounds |
| 11.25-12.00 | J. Larsson, University of Lund, Sweden Picosecond dynamics in semiconductors studied by time-resolved X-ray diffraction |
| 12.00-14.00 | Lunch en rondleiding |
| 14.00-14.35 | M. Tucker, ISIS facility, United Kingdom Taking powder diffraction to its limits: The GEM diffractometer and neutron total scattering |
| 14.35-15.10 | L.A.I. Kestens, TU Delft Electron backscatter and X-ray diffraction: complementary or substitutional techniques for measuring the crystallographic texture? |
| 15.10-15.40 | Koffie/thee |
| 15.40-16.05 | M. Fransen, Panalytical, Almelo We created the monster: ultrafast detectors and their influence on powder diffraction |
| 16.05-16.30 | K. Knorr, Bruker AXS, Delft Quantitative XRD phase analysis in Minerals & Mining: Aluminum |
| 16.30-16.35 | Sluiting door de dagvoorzitter |
| 16.35-18.00 | Borrel |